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SP-SWI/SP-DWI Optical Static/Dynamic Surface Profilometer - Dynamic/Static Morphology Measurement + Resonant Frequency Detection


SP-SWI/SP-DWI optical static/dynamic surface profile measuring instrument can quickly perform nano-level 3D profile measurement and resonance frequency detection.
It can analyze the roughness, flatness, thickness, and step height of the detected object's surface.
- Quick static analysis
SP-DWI/SWI provides a user-friendly interface, non-contact, fast, and nano-level precise 3D profile measurement. It is suitable for analyzing the surfaces of materials with a reflectivity of at least 1%. Roughness and step height analysis can be performed.
- Dynamic measurement
Using high-frequency strobing (>1MHz), SP-DWI can measure the dynamic characteristics of MEMS, such as vibration modes and the surface profile of periodic vibrational motion.